微波信号测试过程中的误差校准分析

Analysis and Calibration for the Error During the Microwave Signal Testing

介绍了S曲线参数测试的原理、误差产生的原因以及开路-短路-负载-直通(OSLT)在片误差消除的方法,通过正向误差模型和反向误差模型,找出相应的12项误差因子,得出S曲线校正模型,提高了测试的准确性。

This paper introduces the principle of S-curve parameter testing,the causes of errors and the method of the open/short/load/through(OSLT)on chip error elimination.Use the forward error model and the inverse error model,obtained the 12 error factors,establishing the S-curve calibration model,the test results accuracy is improved.