定向结晶叶片内部晶体取向无损测定研究

Study on Nondestructive Measurement of Internal Crystal Orientation in Oriented Crystalline Blade

采用短波长特征X射线衍射方法,无损测定镍基高温合金定向结晶叶片内部晶体取向及其分布,阐述其测定原理。通过单点扫描的方式,实现对定向结晶叶片内部一条直线上晶体取向分布的无损检测;通过分析衍射峰宽,实现扫描方向上晶粒尺寸的测量;结合内部晶体取向及扫描测试结果,确定样品内部不同取向的晶粒至少存在5个;通过晶体取向角的梯度变化特征探讨晶界类型的区分。为短波长特征X射线衍射技术用于无损检测定向结晶以及单晶叶片内部晶体缺陷奠定基础。

In this paper,the short wavelength characteristic X-ray diffraction method is used to nondestructive determine the internal crystal orientation and distribution of oriented crystalline blade of nickel base superalloy.The principle of nondestructive determination is also described.By means of single point scanning,the nondestructive detection of crystal orientation distribution on a straight line inside the oriented crystalline blade is realized.By analyzing the diffraction peak width,the grain size in the scanning direction is measured.Combined with the internal crystal orientation and scanning test,it is determined that there are at least 5 grains with different orientations in the sample.The differentiation of grain boundary types is discussed through the gradient variation characteristics of crystal orientation angle.It lays a foundation for the application of short wavelength characteristic X-ray diffraction technology in nondestructive detection of crystal defects in oriented crystalline and single crystal blades.