200 keV脉冲硬X射线源能谱测量技术

Energy Spectrum Measurement for 200 keV Pulsed Hard X-Ray Source

根据基于吸收法的脉冲硬X射线能谱测量的基本原理,以12路Si-PIN探测器阵列及吸收片为测量核心部件,完成了能谱仪的结构设计,并对主要参数进行了实验标定。实验测量了真空环境下大面积脉冲硬X射线源加速器产生的射线强度,获得了不同衰减程度的实验波形。结合不同能量的射线经不同厚度的吸收片后在探测器阵列上的能量沉积,通过解谱获得了脉冲硬X射线的能谱,射线能量最高约为200 keV,平均能量约为51.9 keV。本文能谱测量技术丰富了脉冲射线辐射场参数测量手段,为进一步发展脉冲硬X射线束流诊断研究提供了技术支撑。

By using a pulsed hard X-ray energy spectrum measurement technology based on absorption method,a set of pulsed hard X-ray energy spectrometer is established with 12 channel Si-PIN detector array and absorption plates as the core modules,and the main parameters are calibrated experimentally.The radiation intensity produced by a large area pulsed hard X-ray source accelerator in vacuum environment is measured experimentally,and the experimental waveforms with different attenuation degrees are obtained.Combined with the energy deposition of different energy rays on the detector array after passing through absorption plates with different thicknesses,the energy spectrum of pulsed hard X-rays is obtained,the maximum ray energy is about 200 keV,and the average energy is about 51.9 keV.