基于随机三层环形子电路的路径级NBTI老化预测

Path-level NBTI aging prediction based on random 3-layer ring sub-circuit

纳米工艺水平下,电路可靠性成为电路设计的重要问题。其中,老化又是电路可靠性的主要威胁之一。所以,为了制定老化缓解措施,评估老化以避免电路故障变得至关重要。提出了一种基于随机三层环形子电路的路径级老化预测框架,该框架将NBTI效应作为一种诱导退化机制得到三层环形子电路10年内老化延时,并使用线性回归模型对其老化延时趋势进行学习。之后,基于该模型,可以快速得到电路关键路径的老化延时。实验结果表明,提出的框架在保证精度的同时,时间效率也有较大的提升。

Circuit reliability becomes an important problem in circuit design under the nanometer.Among them,circuit aging is one of the dominant threats to circuit reliability.Therefore,in order to develop aging degradation prediction,it is critical to evaluate aging to avoid circuit failures.In this paper,a path-level aging prediction framework is proposed,based on a random 3-layer ring sub-circuit.The 10-years NBTI-induced aging delay of the sub-circuit is obtained,and the aging delay trend is learned by using a linear regression model.Then,the aging delay of the critical path can be obtained quickly based on the framework.The experimental results show that the proposed framework not only ensures the accuracy,but also greatly improves the time efficiency.