射频集成电路校准技术综述

An Overview on Calibration Techniques for Radio Frequency Integrated Circuits

射频集成电路(RFICs)对工艺偏差、器件失配、器件非线性等引入的静态非理想因素以及温度变化、增益改变、输入/输出频率变动等引入的动态非理想因素所表现出的鲁棒性较差。该文深入挖掘影响射频集成电路性能的关键因素,并对典型的校准算法进行归纳和总结,为高性能射频集成电路设计提供理论支撑。

Radio Frequency Integrated Circuits(RFICs)show poor robustness to static non-ideal factors introduced by process deviations,device mismatches,device nonlinearities,and dynamic non-ideal factors introduced by temperature changes,gain changes,and input/output frequency changes.The key factors that affect the performance of RFICs are excavated deeply,and typical calibration algorithms are summarized to provide theoretical support for the design of high-performance RFICs.