FPGA刷新控制电路测试方法的研究

Research on Test Method of FPGA Refresh Control Circuit

SRAM型现场可编程门阵列(FPGA)电路信号处理性能强大,在航天器中应用非常广泛。但SRAM型FPGA的逻辑单元在存在大量宇宙射线和高能粒子的空间环境中容易发生单元翻转现象,导致器件逻辑功能异常。通过刷新控制电路对FPGA的逻辑功能持续刷新,是当下解决单元翻转问题的通用方法。为了满足抗单粒子翻转的系统需求,FPGA刷新控制电路本身的抗单粒子翻转性能也需要通过一定的试验方法进行充分验证。设计了1种辐照试验测试方法,对FPGA刷新控制电路进行了辐照测试,通过该辐照方法系统地验证了该电路的抗单粒子翻转性能。

SRAM field programmable gate array(FPGA) is widely used in spacecraft because of its powerful signal processing performance. However, the logic unit of SRAM FPGA is prone to unit upset in the space environment where a large number of cosmic rays and high-energy particles are present, resulting in abnormal logic function of the device. Continuously refreshing of the logic function of FPGA by refresh control circuit is a common method to solve the unit upset problem nowadays. In order to meet the system requirements of anti-single event upset, the anti-single event upset performance of FPGA refresh control circuit itself needs to be fully verified by certain test methods. An irradiation test method is designed to test the FPGA refresh control circuit, and the anti-single event upset performance of the circuit is verified by the irradiation test method.