含失调补偿的高速灵敏放大器的设计

Design of high speed sense amplifier with offset compensation

灵敏放大器被用于静态随机存储器中数据的读出,该文针对灵敏放大器的灵敏度及响应速度问题,基于锁存器型灵敏放大器结构,通过对电路的失调来源进行推导,提出一种利用线性电流的反馈进行失调补偿的电压型灵敏放大器。该电路采用UMC 65 nm工艺,仿真结果表明,改进后电路的灵敏度为50 mV,后仿延时为47 ps,数据读出延时为139.4 ps,功耗延时积为2.006×10^(-24)J·s,且电路的延时、功耗延时积受PVT影响较小。与传统结构的电路相比,灵敏放大器失调电压标准差降低了48.57%,数据读出时总延时为原来的51.42%。

Sense amplifiers are used for readout of data in SRAM.The offset source of the latch-type sense amplifier is derived.In response to the sensitivity and delay parameters,the sense amplifier,which is based on the structure of latch-type sense amplifier,is proposed by using linear current feedback to compensate for the offset voltage.Based on the UMC 65 nm process,the simulation results show that the sensitivity of the circuit is 50 mV,the delay is 47 ps,the total delay of readout is 139.4 ps,the power delay product is 2.006×10^(-24)J·s,and the parameters are less affected by PVT.Compared with the latch-type sense amplifier,the standard deviation of the offset voltage is reduced by 48.57%,and the readout delay is 51.42%.