基于微观形貌和成分分析技术的GIS内部异物来源分析与应用

Analysis and Application of Foreign Matter Sources in GIS Based on Micromorphology and Component Analysis Technology

内部异物已成为导致GIS设备故障的主要原因,但目前异物来源分析手段匮乏,故障调查缺少关键证据。首先介绍了材料学领域应用较为成熟的基于扫描电镜的微观形貌观测技术和基于能谱仪的成分分析技术,并将其引入电气工程领域;其次结合GIS实际故障案例现场收集相关分解物和异物,并完成制样;最后通过上述两项技术的应用,分析了内部各分解物和异物的来源,为今后此类故障分析和调查提供了借鉴。

Internal foreign matter has become the main reason for the failure of GIS equipment,but at present there is a lack of analysis methods for the source of foreign matter,and the failure investigation lacks key evidence.Firstly,the relatively mature application of scanning electron microscope-based microscopic topography observation technology and energy spectrometer-based composition analysis technology in the field of materials science are introduced,and they are introduced into the field of electrical engineering;secondly,relevant decomposition products and foreign bodies are collected on-site in combination with actual GIS failure cases,and complete the sample preparation;finally,through the application of the above two technologies,the sources of the internal decomposition products and foreign bodies are analyzed,which provides a reference for the future analysis and investigation of such failures.