AFM探针在木材样品测试中的选择与应用

Selection and Application of AFM Probe in Wood Sample Testing

原子力显微镜(AFM)可用于样品表面形貌纳米级观察,并可得到杨氏模量、摩擦力等各种物理参数,但原子力显微镜所使用的探针种类繁多,功能各异,选择合适的探针对获得满意的图象和其他信息至关重要。针对探针的构造进行了系统介绍,对各种功能的探针进行了分类说明,对检测不同木材样品时的探针选择给出了建议,为科研工作者使用AFM时的探针选择提供技术参考。

Atomic force microscopy(AFM) can be used to observe the surface morphology of samples at the nanometer level and obtain various physical parameters such as Young’s modulus and friction force.However, AFM uses a wide variety of probes with different functions.Selecting a suitable probe is crucial to obtain satisfactory images and other information.This paper systematically introduces the structure of probes, classifies probes with various functions, and gives suggestions on the selection of probes when detecting different wood samples, which provides technical reference for researchers in the selection of probes when using AFM.