一种扩展紧缩场低频测试频率的时域测试方法

A Time-domain Test Method for Low Frequency Test Frequency of Extended Compact Range

文章介绍了一种提高紧缩场下限频率的时域测试方法,在现有紧缩场测试频率1~40 GHz的测试能力下,在不破坏原有系统硬件的情况下,利用现有的反射面系统,增加几台时域测试设备,可将紧缩场的下限测试频率由原来的截止频率1 GHz扩展至0.3~1 GHz,满足某些产品的测试要求,提高紧缩场的测试能力与测试精度,并且通过实验证明了该测试方法的可行性。

This paper introduces a time-domain test method to improve the lower limit frequency of the compact range.Under the test ability of the existing compact range test frequency of 1~40 GHz,without damaging the original system hardware,using the existing reflector system and adding several time-domain test equipment,the lower limit test frequency of the compact range can be expanded from the original cut-off frequency of 1 GHz to 0.3~1 GHz,meeting the test requirements of some products,The test capability and precision of the compact range are improved,and the feasibility of the test method is proved by experiments.