一种含银敷料银元素化学态表征方法

Method for the Characterization of the Chemical State of the Silver Element in Silver-containing Dressings

作为医疗领域中极为常见的一种抗菌产品,敷料可有效控制创面微生物环境;而敷料中银的存在形式(单质银及银离子)及其含量会在不同程度上引发潜在的生物安全性风险,需要利用X射线光电子能谱仪(XPS)对银元素进行化学态表征。不同化学态Ag元素对应参考峰位差异较小的现状限制了X射线光电子能谱仪在抗菌敷料领域中的广泛应用。本工作创新性地提出了一种银元素化学态准确表征方法:通过明确提出影响数据质量的重要仪器参数,并在确保XPS仪器正常状态的前提下进行数据采集;根据抗菌敷料所含元素种类制定特定内标校准(金属氯化物Cl2p:197.8eV)的荷电校准法,进一步通过参考谱峰峰位接近法判定实际含银敷料样品中银元素化学态。X射线衍射法(XRD)测试结果进一步确认了XPS表征抗菌敷料中银元素化学态方法的准确性和可靠性。

As a very common antibacterial product in the medical field,dressings can effectively control the microbial environment on the wound surface.However,the chemical state of silver(elemental silver and silver ion)and its content in the dressing may lead to potential biosafety risks to varying degrees,so it is necessary to use X-ray photoelectron spectroscopy(XPS)to characterize the chemical state of silver element.The small differences in the positions of reference peaks corresponding to the different chemical states of the silver element limit the wide application of X-ray photoelectron spectroscopy(XPS)in the field of antiseptic dressings.This work proposed an innovative XPS-based method for the accurate characterization of the chemical state of silver in antiseptic dressings.Data acquisition was carried out to validate XPS.A charge calibration method that met specific internal standards was formulated in accordance with the types of elements present in antiseptic dressings,and the chemical state of the silver element in actual silver-containing dressing samples was further determined by using the spectral peak position approaching method.The accuracy and reliability of the XPS-based method in characterizing the chemical state of silver in antiseptic dressings were verified by the results of X-ray diffraction analysis.