摘要
介绍了探针测试的现状,基于探针设备的硬件结构,探索设计一种“四芯”测试算法,达到提高测试效率的目标。实验结果表明了“四芯”测试算法的可行性及有效性。
The current situation of probe testing is introduced in this paper. Based on the hardware structure of probe system,designed the corresponding “Four Sites”algorithm test flow,the goal of improving production efficiency is realized. Experimental results show the feasibility and effectiveness of the optimization algorithm.
作者
胡晓霞
李猛
方敏晰
温建军
HU Xiaoxia;LI Meng;FANG Minxi;WEN Jianjun(The 45^(th) Research Institute of CETC,Beijing 100176,China;Sanhe Wuatech Co.,Ltd.,Yanjiao 065201,China)
出处
《电子工业专用设备》
2022年第6期49-52,66,共5页
Equipment for Electronic Products Manufacturing