液晶盒厚的均一性研究

Study on Uniformity of Cell Gap

根据液晶量的计算模型进行了理论模拟,基于模拟结果对各因子进行实验设计,并在实际生产中对提升盒厚均一性的方案进行了验证。实验结果表明,影响液晶盒厚均一性的关键因子是隔垫层、像素间段差和阵列基板侧段差,对盒厚工程能力指数的影响分别为0.9、0.8和0.6。在阵列基板侧使用有机膜可以将盒厚的工程能力指数提升0.6,采用交叉隔垫层可以将盒厚的工程能力指数提升0.9。降低彩膜侧段差最有效的方法是导入平坦层进行平坦化,高平坦性材料和普通材料的平坦层可分别将盒厚的工程能力指数提升0.5和0.2。

Theoretical simulation was conducted by a model for calculating amounts of liquid crystal,and experiments were carried out for each factor.The measurements for improving uniformity of cell gap were tested on some products.The experiments results showed that PS,altitude difference on array substrate and altitude difference on color film substrate were critical factors affecting uniformity of cell gap,the three factors that could affect the Cpk value of cell gap were 0.9,0.5 and 0.8,respectively.The Cpk of cell gap could increase 0.6 by using organic on array substrate,while that couldincrease 0.9 by using XPS.The best way to reduce altitude difference among pixels was using OC,which showed that normal OC and highly flat OC could increase the Cpk of cell gap by 0.2 and 0.5,respectively.