摘要
在各种诊断X射线辐射源检定规程或校准规范中都对半值层测量提出了要求,半值层测量仪也得到广泛应用,但半值层测量仪的校准方法一直未明确。探讨在校准半值层测量仪过程中的主要影响因素,结果表明探测器角度对测量结果影响最大,因此校准时要将被校半值层测量仪置于测试平面中心位置,角度偏差不应超过±1°。
The half-value layer measurement is required in various diagnostic X-ray radiation source verification regulations or calibration specifications,and half value layer measuring instruments are also widely used,but the calibration method of half value layer measuring instruments has not been clear.The main influencing factors in the calibration of the half value layer measuring instrument are discussed.The results show that the detector angle has the greatest influence on the measurement results.Therefore,the half value layer measuring instrument to be calibrated should be placed in the center of the test plane during calibration,and the angle deviation should not exceed±1°.
作者
魏鹏
王家伟
李德红
马伯轩
郭彬
WEI Peng;WANG Jia-wei;LI De-hong;MA Bo-xuan;GUO Bin(Fujian Institute of Metrology,Fuzhou,Fujian 350003,China;Anhui Institute of Metrology,Hefei,Anhui 230051,China;National Institute of Metrology,Beijing 100029,China)
出处
《计量学报》
CSCD
北大核心
2023年第1期127-131,共5页
Acta Metrologica Sinica
基金
国家市场监督管理总局能力提升专项(ANL2210)。