摘要
加速寿命试验是在不改变失效机理的条件下加大应力进行的试验,它可以通过大幅度地缩短试验时间来评估元器件长周期的可靠性。首先,采用不同的温度加速和电压加速条件得到了MLCC的失效分布;然后,利用Weibull分布中的形状参数来分析失效模式的差异;最终,基于经验公式拟合得到了加速指数,可以对相同的材料体系下MLCC的使用寿命及失效率分布进行预测,由此对MLCC的寿命评估起到一定的参考和借鉴作用.
Accelerated life test is a test that increases the stress without changing the failure mechanism.It can be used to evaluate the reliability of components over a long period of time by remarkably shortening the test time.Firstly,different temperature and voltage acceleration conditions are used to obtain the failure distribution of MLCC,and the shape parameters in Weibull distribution are used to analyze the difference of failure modes.Finally,the acceleration factor is obtained based on empirical formula fitting,which can predict the working life and failure rate distribution of MLCC under the same material system.
作者
黄翔
敖宏
宋进祥
邓积吉
HUANG Xiang;AO Hong;SONG Jinxiang;DENG Jiji(Guangdong VIIYONG Electronic Technology Co.,Ltd.,Yunfu 527200,China)
出处
《电子产品可靠性与环境试验》
2022年第6期20-24,共5页
Electronic Product Reliability and Environmental Testing