一种数字电路单粒子翻转测试方法

A Test Method of Single Event Upsets for Digital Circuits

为提高航天器系统设计的可靠性,避免单粒子效应对航天器系统造成损坏,在单粒子翻转经典测试方法"黄金芯片比较法"的基础上,设计一种硬件实现的测试方法。方法通过对输出高低电平相关区域的重新取舍,采用合适芯片从硬件上实现数据选择器、锁存器与数值比较器的功能优化,并进行FPGA移植,以解决经典方法在电平翻转时出现误判的问题。同时也详细阐述了移植FPGA过程中的器件选取与程序设计。实际测试表明,改进后的测试方法获得了良好的抗干扰性,为单粒子效应模拟试验提供有效的支持。

In order to improve the reliability of spacecraft system design and avoid damage to spacecraft system caused by single event effect,a hardware-based test method is designed based on the classic test method of single event flip“Gold Chip Comparison Method”.By re-selecting the relevant areas of the high and low output levels,and using appropriate chips to optimizate the data selector,the latch and the numerical comparator in hardware and transplanting them to FPGA,the problem of misjudgment in the level flip of classical methods is solved.The device selection and program design in the process of FPGA transplantion are also described in detail.The actual test shows that the improved test method has achieved good anti-interference performance,which provides an effective test support for single event effect simulation test.