期刊文献+

软硬结合板孔周边聚酰亚胺撕裂改善研究

The improvement of PI material tearing around the hole in R-FPCB
下载PDF
导出
摘要 软硬结合板孔周边聚酰亚胺(PI)撕裂为偶发的不良现象,业内一般通过调整钻孔参数进行改善,但这种调整会增加生产成本,且改善效果不明显。为彻底解决这一问题,本文通过试验对比不同钻孔参数和软板材料。结果表明:PI撕裂不良的根本原因是软板材料的抗撕裂强度低,使用不同钻刀和提高转速均无法改善,替换抗撕裂强度更大的软板材料制作可完全解决问题。研究结果以期为业界制作高可靠性的软硬结合板产品提供依据,为认证软板材料提供借鉴。 PI tearing around the hole is an occasional adverse phenomenon in R-FPCB, which is generally improved by adjusting parameters in the industry. However, such adjustment takes increasing production cost as the cost, and the improvement effect is not obvious. In order to completely solve this problem, through the test comparison of different drilling parameters and different PI, it is concluded that PI root with poor tearing with low tearing strength,which can not be improved by using different drilling tools and increasing the rotate speed. This finding provides the basis for the manufacture of high reliability R-FPCB, also provides a reference method for the certification of FPCB.
作者 朱光远 钟美娟 肖璐 ZHU Guangyuan;ZHONG Meijuan;XIAO Lu(Shengyi Electronics Co.,Ltd.,Dongguan 523127,Guangdong,China)
出处 《印制电路信息》 2023年第1期38-44,共7页 Printed Circuit Information
关键词 软硬结合板 孔周边PI撕裂 抗撕裂强度 R-FPCB PI tear around the hole tear strength
  • 相关文献

参考文献1

二级参考文献10

  • 1Mark M. Konarski. Effects of Tg and CTE onSemiconductor Encapsulants. Loctite Corporation technical paper.
  • 2Tom Buck. Laminate Materials and Reliability Issuesfor Pb-free Electronics. DDI Co. presentation.
  • 3Mirman B.A. Mathematical model of a plated-through hole under a load induced by thermal mismatch[J]. IEEE Transactions on Components, Hybrids and Manufacturing Technology, Dec. 1988, Vol. 11 (4): 506-511.
  • 4Goval D., Azimi H., Kim Poh Chong, Mirng-JiLii. Reliability of High Aspect Ratio Plated Through Holes(PTH) for Advanced Printed Circuit Board(PCB) Packages[A]. The 35th Annual Proceedings Reliability Physics Symposium, IEEE Internat ional[C]. 8-10 April 1997, 129-135.
  • 5Bhandarkar S.M., Dasgupta A., Barker D., et al.Influence of Selected Design Variables on Thermo mechanical Stress Distributions in Plated-ThroughHole Structures [J]. Transaction of the ASME Journal of Electronic Packaging, March 1992, Vol: 114: 8-13.
  • 6孙博,谢劲松,康锐.印制电路板镀通孔应力一应变分布的简化模型[J].2005第十一届全国可靠性物理学术讨论会,102-111.
  • 7Xie Jingsong, Kang Rui, Zhang Yuan, et al. A PTHreliability model considering barrel stress distributions and multiple PTHs in a PWB[C]. The 44th Annual IEEE International Reliability Physics Symposium. 2006: 256-265.
  • 8IPC-TR-579, Round Robin Reliability Evaluation of Small Diameter Plated Through Holes in Printed Wiring Boards, IPC Technical Report, September 1988.
  • 9Zhang Y. Critical design factors analysis to thereliability of high aspect ratio PTH[J]. Solutions for Reliable assembles, China SMT Forum 2007:220-231.
  • 10陈颖,霍玉杰,谢劲松,张源.印刷线路板设计参数对镀通孔可靠性的影响[J].北京航空航天大学学报,2007,33(8):954-958. 被引量:3

共引文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部