窄线宽半导体激光器线宽测试研究

Linewidth Measurement of Semiconductor Laser with Narrow Linewidth

随着光探测领域的持续发展,窄线宽半导体激光器在各领域已经得到了广泛应用并发挥出独特价值。本研究以激光器线宽特性为研究内容展开分析,介绍了一类以β算法为基础的线宽表征方法,并借助仿真模拟获取了不同频域范围下激光线型、频率噪声等与激光线宽之间的关系,进一步说明了该线宽测试方式。

With the continuous development of the field of light detection,narrow line width semiconductor laser has been widely used in various fields and play a unique value.In this research,the linewidth characteristics of laser is analyzed,a class of linewidth characterization method based onβalgorithm is introduced,and the relationship between laser linewidth,frequency noise and laser linewidth in different frequency domain is obtained by simulation,and the linewidth measurement method is further explained.