电力设备中FPGA单粒子效应研究

Research on Single Event Effects in FPGA of Electric Power Equipment

FPGA在电力设备中大规模应用后,其长时间运行的可靠性一直受到单粒子效应的影响。宇宙射线中的高能粒子穿过大气层后,会在FPGA芯片中造成单粒子翻转、单粒子锁存等故障。针对以上现象,分析了单粒子效应的形成机理及影响因素,计算了常用FPGA芯片的单粒子翻转故障概率。以需要长时间稳定运行的电力设备为对象,提出了芯片防护、系统防护、逻辑备份、数据校验、硬件检测等缓解方法。结果表明,这些措施可以有效减少FPGA中因单粒子效应而产生的故障。

After the large-scale application of FPGA in electric power equipment,the reliability of its long-term operation has been affected by the single event effects.After high-energy particles in cosmic rays pass through the atmosphere,they will cause single-event upset,single-event latching and other failures in the FPGA chip.Aiming at the above phenomenon,the generation mechanism and influencing factors of the single event effects are analyzed,and the failure probability of single event upset of commonly used FPGA chips is calculated.Considering long time stably operate of electric power equipment,mitigation methods such as chip protection,system protection,logical backup,data verification,and hardware detection are proposed.The results show that these measures can effectively reduce the failures caused by the single-particle effect in FPGA.