摘要
本文报道了一种基于双模波长调制的高频碳化硅(Silicon carbide,SiC)传感器及其在并光学微机电系统(Microelectromechanical systems,MEMS)中应用。基于碳化硅材料属性及双模分析,设计了一种适用于高频场的光学MEMS传感器,并利用ANSYS有限元分析(Finite element analysis,FEA)方法和严格耦合波分析(Rigorous coupled wave analysis,RCWA)方法,将其与其他高频传感器进行性能比较。结果表明,该光学传感器在整个操作测量范围内可提供2.2477(Δλ/Δa)的光学灵敏度、0.155 nm/g的机械灵敏度和几乎为零的交叉轴灵敏度,且第一谐振频率为40.035 kHz,线性测量范围为±129.03 g,传感系统灵敏度(Δλ/Δa)为0.3484 nm/g,工作带宽为35 kHz。
This paper reports a high-frequency silicon carbide(SiC)sensor that relies on dual-mode wavelength modulation and its application to optical microelectromechanical systems(MEMS).Based on the properties of as well as SiC and the characteristics of dual-mode analysis,an optical MEMS sensor suitable for a high-frequency field is designed.In addition,the finite element analysis(FEA)method with ANSYS and the rigorous coupled wave analysis(RCWA)method are used.A comparison with other high-frequency sensors shows that the proposed sensor displays advantages with respect to properties such as a wide measurement range,high sensitivity,and almost zero cross-axis sensitivity.The proposed optical sensor provides an optical sensitivity(Δλ/Δa)of 2.2477,a mechanical sensitivity of 0.155 nm/g and an almost zero cross-axis sensitivity in the entire operation measurement range.The first resonance frequency is 40.035 kHz,the linear measurement range is±129.03 g,the sensitivity of the sensing system(Δλ/Δa)is 0.3484 nm/g,and the working bandwidth is 35 kHz.
作者
黄堃
程林
曲帅
刘驭湘
崔建功
贺鑫慧
胡琴
HUANG Kun;CHENG Lin;QU Shuai;LIU Yuxiang;CUI Jiangong;HE Xinhui;HU Qin(Upgrading Office of Modern College of Humanities and Sciences,Shanxi Normal University,Linfen 041000,China;State Key Laboratory of Dynamic Testing Technology,North University of China,Taiyuan 030051,China)
基金
Graduate Education Reform Project(No.18001215)
Scientific and Technological Innovation Project(No.18004438)。
关键词
微机电系统
波长调制
光学加速度计
microelectromechanical system(MEMS)
wavelength modulation
optical accelerometer