基于ATE的可编程高集成度SIP芯片测试技术研究

Research on Programmable and Highly Integrated SIP Test Method Based on ATE

随着可编程系统级电路的内部器件数量和规模的不断增长,SIP内部器件的可测性问题也变得越来越突出。提出了一种基于ATE的SIP测试方法,并对其FPGA、DSP配置、功能调试和参数测试方法进行了介绍。该测试方法准确、系统、效率高,可以满足大部分可编程高集成度SIP电路的测试需求。

With the inc「easing numbe r and scale of inte rnal devices in system in progr ammable(SIP)ci rcuits,the problems of testability of internal devices in SIP are becoming more and more prominent.A SIP test method based on ATE is presented,and the configuration of FPGA and DSP,function debugging and parameter testing are introduced.The method is accurate,systematic and efficient,and can meet the testing requirments of most programmable and highly integrated SIP circuits.