摘要
阐述IGBT功率循环加速老化试验平台的设计,老化试验步骤,提出了IGBT老化状态评估方法。试验结果表明:随着老化进程的加剧,IGBT饱和导通压降呈现增加的趋势,基于加速老化试验的IGBT状态评估方法科学有效、可行性高。
This paper describes the design and aging test steps of the IGBT power cycle accelerated aging test platform,and proposes an evaluation method for IGBT aging status.The test results show that as the aging process intensifies,the saturated conduction voltage drop of IGBT presents an increasing trend,and the IGBT state evaluation method based on accelerated aging test is scientific,effective,and highly feasible.
作者
郭天星
GUO Tianxing(Department of Mechanical and Electrical Engineering,Shanxi Railway Vocational and Technical College,Shanxi 030013,China)
出处
《电子技术（上海）》
2023年第3期4-5,共2页
Electronic Technology
关键词
IGBT
加速老化试验
饱和导通压降
状态评估
IGBT
accelerated aging test
saturation conduction voltage drop
status evaluation
