利用光学跟踪与结构光扫描相结合的高精度测量方法

High-precision measurement method using structure light scanning and optical tracking

结构光扫描测量是广泛应用于精密生产制造的方法之一,相对于常见测量方法具有较高的点密度、点位精度,以及非接触测量的优势。针对常规的结构光扫描测量存在的测量范围小、路点示教耗时烦琐等不足,本文提出了一种光学跟踪器与结构光扫描仪相结合的测量方法。利用光学跟踪器实时测量结构光扫描仪的空间姿态,将扫描点云实时转换至同一坐标系中,实现了大尺寸、高点密度、高精度实时测量。通过反射面型面的非接触测量试验对该方法的测量精度进行评价。试验结果表明,对于直径为3.1 m的大型反射面,扫描结果与数模的最佳拟合RMSE最小为0.067 mm,优于型面制造要求的0.15 mm精度,可满足高精度的工业生产制造精度要求。

Structured light scanning measurement is one of the methods widely used in precision manufacturing.Compared with common measurement methods,it has the advantages of higher point density,point accuracy,and non-contact measurement.Aiming at the shortcomings of conventional structured light scanning measurement,such as small measurement range and time-consuming and cumbersome waypoint teaching,a measurement method combining optical tracker and structured light scanner is proposed.The optical tracker is used to measure the spatial attitude of the structured light scanner in real-time,and the scanned point cloud is converted into the same coordinate system in real-time,realizing real-time measurement of large size,high point density high precision,and non-contact measurement of the reflective surface.The test evaluates the measurement accuracy of this method.The test results show that for a large reflective surface with a diameter of 3.1 m,the best fitting RMSE between the scanning results and the digital-analog is at least 0.067 mm,which is better than the precision of 0.15 mm required for profile manufacturing and can meet the precision requirements of high-precision industrial production.