仿真与试验结合的电子产品可靠性评估方法

Reliability Assessment for Electronic Products by Combination of Simulation and Test

建立一种仿真与试验结合的电子产品可靠性评估方法,基于Bayes理论利用试验数据对已有的可靠性仿真结果进行更新。针对电子产品中广泛应用的指数分布,分别对平均寿命和失效率进行了详细讨论,给出其置信度和置信限的评估方法。在此基础上,为便于工程实际应用,进一步建立数值计算方法,并给出可靠寿命和可靠度的置信下限。理论分析和算例结果表明,本文方法通过对仿真信息和试验信息的融合利用,不仅可以减少试验量,而且能够有效提高电子产品可靠性评定精度和置信水平。

A reliability assessment method for electronic products by combining simulation and test is proposed,which can update the reliability simulation results by utilizing test data based on the Bayesian theory.For the frequently used exponential distribution among electronic products,average lifetime and failure rate are discussed respectively in great detail,and estimation method of corresponding confidence level and confidence limit are also presented.Thereafter,numerical calculating strategy and one-side lower confidence limits of reliable life and reliability are further given to facilitate the practical application.Theoretical analyses and computational results of illustrative example indicate that,our proposed method can not only save a large amount of test but also enhance the reliability evaluation precision by utilizing both simulation and test information comprehensively.