拓扑绝缘体能带结构的角分辨光电子能谱研究

ARPES studies of the band structures of topological insulators

以拓扑不变量定义和区分的拓扑材料的发现标志着凝聚态物理学和材料科学的又一次革命.这些材料的拓扑表面态的鲁棒性、背散射禁戒和特殊的输运行为在自旋电子学、非线性光学、拓扑量子计算等广泛的领域有潜在的应用价值.角分辨光电子能谱(ARPES)既能直接观察k空间,又对表面电子态敏感,因此在拓扑材料的研究中一直处于举足轻重的地位.本文试从材料分类的角度对三维拓扑绝缘体和本征磁性拓扑绝缘体这两类材料的部分ARPES研究作一综述,使读者对这一领域的研究现状有一个基本的概念.

The discovery of topological materials,defined by topological invariants,has revolutionized condensed matter physics and materials science.The robustness of the topological surface states,backscattering suppression,and novel transport behavior of these materials have potential applications in several fields,including spintronics,nonlinear optics,and topological quantum computation.Angle-resolved photoemission spectroscopy(ARPES)can provide the k space directly and is sensitive to surface electronic states,thus playing an essential role in the study of topological materials.This review summarizes selected ARPES studies of three-dimensional and intrinsic magnetic topological insulators in terms of material classification to provide the current research status in this field.