三维材料和界面体系电子结构的软X射线ARPES研究

Soft X-ray angle-resolved photoemission studies on the electronic structure of three-dimensional materials and interfacial systems

关联电子体系拥有丰富的量子现象,理解这些量子现象的机理离不开对其电子结构的细致观测.然而很多有趣的体系都具有三维的晶体结构或者是深埋的界面态,而电子结构观测往往是表面敏感的探测手段,例如角分辨光电子能谱等,给实验研究带来巨大的挑战.随着同步辐射光束线的发展,软X射线波段的角分辨光电子能谱开始投入使用,给三维体系和界面体系的电子结构研究带来曙光.本文将系统介绍软X射线角分辨光电子能谱的科学目标、实验上的优势和技术挑战以及简要发展历程;结合研究实例,着重介绍该技术在获取三维本征体态电子结构、探测界面态电子结构、对3d过渡元素和4f稀土元素的共振测量以及与真空紫外波段角分辨光电子能谱配合研究方面的应用.最后给出对该技术进一步发展的展望与国内现状.

Quantum phenomena abound in correlated electron systems.Understanding the mechanisms of these quantum phenomena requires a comprehensive study of their electronic structures.However,many interesting systems are in three-dimensional crystal structures or at deeply buried interfaces,and direct electronic structure observations often rely on surface-sensitive techniques,such as angle-resolved photoelectron spectroscopy,which pose great challenges.Angleresolved photoelectron spectroscopy utilizing soft X-ray photons has been possible with the development of synchrotron radiation beamlines,allowing studies to explore electronic structures in three-dimensional systems and interfacial systems.This paper will introduce the scientific goals,experimental advantages,and technological obstacles of soft Xray angle-resolved photoelectron spectroscopy,as well as a brief development history of the technique.We will discuss the advantage of this technology in obtaining three-dimensional intrinsic bulk electronic structures,detecting deeply buried interfacial states,taking resonance measurements of 3d transition elements and 4f rare earth elements,and conducting cooperative research with vacuum ultraviolet angle-resolved photoelectron spectroscopy.Finally,the future development of this technology and its domestic status in China are discussed.