期刊文献+

空腔型压电薄膜体声波谐振器的仿真研究

Simulation Research on Cavity Piezoelectric Film Bulk Acoustic Resonator
下载PDF
导出
摘要 微机电加工技术的迅速发展与集成电路技术的日益成熟,射频前端设备中的器件朝着小型化、集成化方向发展。压电薄膜体声波谐振器(Film bulk acoustic resonator, FBAR)逐渐成为通信滤波器的研究热点之一。首先基于射频仿真软件ADS 2019,首先采用一维Mason等效电路模型对FBAR器件的谐振频率特性进行模拟,得到FBAR的各膜层厚度以及谐振面积均对频率-阻抗特性有影响。其次以此Mason模型的仿真结果确定各膜层的材料与厚度,根据压电层的材料厚度对MBVD模型的参数提取过程进行了说明。最后以MBVD为模型设计的FBAR的频率达到了3.4GHz及以上,串联谐振频率fs为3.714GHz,并联谐振频率fp为3.811GHz,且S21的值优于-3dB,具体为-0.156dB,有效机电耦合系数约为6.28%,串联谐振因子Qs约为621.17,并联谐振因子Qp约为666.54。 With the rapid development of micro-electromechanical processing technology and the increasing matu-rity of integrated circuit technology,the devices in the radio frequency front-end equipment are developing in the di-rection of miniaturization and integration.The piezoelectric film bulk acoustic resonator(FBAR)has gradually become one of the research hotspots of communication filters.In this paper,we first derived the FBAR's electrical impedance theoretical model,and then used the 1-D Mason model to simulate the resonant frequency characteristics of the FBAR device based on the radio frequency simulation software ADS 2019,and the film thickness and resonant area obtained form the FBAR have an influence on the frequency-impedance characteristics.Secondly,the material and thickness of each film layer were determined based on the simulation results of the Mason model,and the parameter extraction process of the MBVD model was explained according to the material thickness of the piezoelectric layer.Fi-nally,the frequency of the FBAR designed with MBVD as the model reached 3.4GHz and above,the series reso-nance frequency fs was 3.714GHz,the parallel resonance frequencyfp was 3.811GHz,and the value of S21 was bet-ter than-3dB,specifically-0.156dB,and the effective electromechanical coupling coefficient was about 6.28%,the series resonance factor Qs is about 621.17,and the parallel resonance factor Qp was about 666.54.
作者 徐霖 吴秀山 施阁 XU Lin;WU Xiu-shan;SHI Ge(College of Mechanical and Electrical Engineering,China Jiliang University,Hangzhou Zhejiang 310018,China;College of Electrical Engineering,Zhejiang University of Water Resources and Electric Power,Hangzhou Zhejiang 310018,China)
出处 《计算机仿真》 北大核心 2023年第5期289-294,共6页 Computer Simulation
基金 浙江省自然科学基金资助项目(LY21F040001)。
关键词 薄膜体声波谐振器 谐振频率 膜层厚度 频率特性 Film bulk acoustic resonator(FBAR) Resonance frequency Film thickness Frequency characteristics
  • 相关文献

参考文献3

二级参考文献18

  • 1蒋松涛,吴孟强,吴勇,张树人.薄膜体声波滤波器的材料、设计及应用[J].材料导报,2006,20(11):21-24. 被引量:5
  • 2LAKIN K M. A review of thin-film resonator technology [J]. IEEE Microwave Magazine, 2003, 4 (4) : 61 - 67.
  • 3ROSENBAUM J F. Bulk acoustic wave theory and devices [M]. Boston: Artech House Press, 1988.
  • 4LAKIN K M, McCARRON K T, ROSE R E. Solidly moun- ted resonators and filters [C] // Proceedings of Ultrasonics Symposium. Seattle, WA, USA, 1995, 2: 905-908.
  • 5LAKIN K M, KLINE G R, MeCARRON K T. High-Q mi- crowave acoustic resonators and filters [J]- IEEE Transac- tions on Microwave Theory and Techniques, 1993, 41 (12): 2139- 2146.
  • 6POZAR D M. Microwave engineering [M]. New York: John Wiley Sons, 2009.
  • 7EBENEZER D D, ABRAHAM P. Piezoelectric thin shell theoretical model and eigenfunetion analysis of radially pola- rized ceramic cylinders [J]. The Journal of the Acoustical Society of America, 1999, 105 (1) .. 154 - 163.
  • 8汤亮,郝震宏,乔东海.2.4GHz射频薄膜体声波谐振器的研制[J].功能材料与器件学报,2009,15(1):27-33. 被引量:5
  • 9王胜福,许悦,郑升灵,韩东.1.8GHz AlN薄膜体声波谐振器的研制[J].半导体技术,2012,37(2):146-149. 被引量:5
  • 10李丽,郑升灵,李丰,李宏军.S波段FBAR滤波器芯片的研制[J].压电与声光,2013,35(5):617-619. 被引量:9

共引文献9

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部