摘要
Recently,the Darna distribution has been introduced as a new lifetime distribution.The two-parameter Darna distribution represents is a mixture of two well-known gamma and exponential distributions.A manufacturer or an engineer of products conducts life testing to examine whether the quality level of products meets the customer’s requirements,such as reliability or the minimum lifetime.In this article,an attribute modified chain sampling inspection plan based on the time truncated life test is proposed for items whose lifetime follows the Darna distribution.The plan parameters,including the sample size,the acceptance number,and the past lot result of the proposed sampling plan,are determined with the help of the two-point approach considering the acceptable quality level(AQL)and the limiting quality level(LQL).The plan parameters and the corresponding operating characteristic functions of a new plan are provided in tabular form for various Darna distribution parameters.Also,a few illustrated examples are presented for various distribution parameters.The usefulness of the proposed attribute modified chain sampling plan is investigated using two real failure time datasets.The results indicate that the proposed sampling plan can reduce the sample size when the termination ratio increases for fixed values of the producer’s risk and acceptance number.Hence,the proposed attribute modified chain sampling inspection plan is recommended to practitioners in the field.
基金
A.R.A.Alanzi would like to thank the Deanship of Scientific Research at Majmaah University for financial support and encouragement.
