基于深度学习的大批量集成电路故障检测技术应用

Application of Fault Detection Technology for Large Batch Integrated Circuits Based on Deep Learning

阐述智能技术实现集成电路基板故障检测,可提高检测效率、提高检测结果的准确性,依据检测结果对集成电路设计进行调整改进,同时可作为参考依据,不断对集成电路基板进行优化设计。

This paper expounds that intelligent technology can realize integrated circuit substrate fault detection,which can improve the detection efficiency and accuracy of detection results.According to the detection results,integrated circuit design can be adjusted and improved,and can be used as a reference to continuously optimize the design of integrated circuit substrates.