基于AEC标准的汽车芯片可靠性测试方法研究

Study on reliability test method of automotive chips based on AEC standard

近年来,自动驾驶技术逐渐成为Tier1汽车电子智能系统的最先进技术,解决自动驾驶技术的关键在于提升自动驾驶芯片的可靠性,保障汽车运行中的安全。目前国内尚未有关于汽车芯片可靠性的标准,该文基于国际AEC-Q100系列标准,结合可靠性加速因子,研究了可靠性测试方法以及数据管控方法,根据参数零件平均测试PPAT方法,优化了静态PAT和动态PAT测试流程,为提高国产汽车芯片质量可靠性提供一定的参考依据。

In recent years,automatic driving technology has gradually become the most advanced technology of Tier1 automobile electronic intelligent system.The key to solving the automatic driving technology is to improve the reliability of automatic driving chip and ensure the safety of automobile operation,there is no domestic standard on the reliability of automobile chips.Based on the international AEC-Q100 series standards,combined with the reliability acceleration factor,this paper systematically studies the reliability test method and data control method,and optimizes the static PAT and dynamic PAT test process combined with the parameter part average test PPAT method.It provides a certain reference basis for improving the quality and reliability of domestic automobile chips.