期刊文献+

基于SVMD-HD去噪的白光干涉解调算法

White-light interference demodulation algorithm based on SVMD-HD denoising
下载PDF
导出
摘要 垂直扫描白光干涉法(VSWLI)是一种非接触式三维表面轮廓测量方法。蝙蝠翼作为VSWLI当中一种固有的缺陷,尤其在被测样品的台阶高度小于光源的相干长度时,台阶边缘处的蝙蝠翼尤为显著。相移干涉法不存在这种缺陷,但是存在相位模糊的问题。提出一种将Carré等步长相移算法与快速傅里叶变换(FFT)相干峰值检测技术相结合的白光干涉解调算法。该算法基于逐次变分模态分解(SVMD)与Hausdorff距离(HD)联合去噪。分别以高度为500 nm和1200 nm的连续台阶器件和高度为10μm的标准台阶作为测试样品,进行实验测量验证。所提出的算法能够有效地抑制台阶高度跳变处的蝙蝠翼,克服相位模糊问题。 Vertical-scanning white light interferometry(VSWLI)is a non-contact three-dimensional surface profile measurement method.As an inherent defect in VSWLI,the batwings are especially significant at the step edge when the step height of the measured sample is smaller than the coherent length of the light source.The phase-shifting interferometry does not suffer from it,but has phase ambiguity problems.A white-light interference demodulation algorithm that combined Carréequal-step phase-shifting algorithm with fast Fourier transform(FFT)coherence-peak-sensing technique was proposed to overcome the above problems.This algorithm was based on successive variational mode decomposition(SVMD)combined with Hausdorff distance(HD)denoising.The continuous step devices at 500 nm and 1200 nm height and the standard steps at 10μm height were used as test samples for verification of experimental measurements.The proposed algorithm can effectively suppress the batwings effect at the step edges and remove the phase-ambiguity problems.
作者 邢伦 桑梅 石珍曼 王双 刘铁根 XING Lun;SANG Mei;SHI Zhenman;WANG Shuang;LIU Tiegen(School of Precision Instrument and Opto-electronics Engineering,Tianjin University,Tianjin 300072,China;Key Laboratory of Opto-electronics Information Technology(Ministry of Education),Tianjin 300072,China)
出处 《应用光学》 CAS 北大核心 2023年第4期816-825,共10页 Journal of Applied Optics
基金 国家重点研发计划(2018YFF01013203)。
关键词 垂直扫描白光干涉法 相移干涉法 逐次变分模态分解 蝙蝠翼 相位模糊 vertical-scanning white light interferometry phase-shifting interferometry successive variational mode decomposition batwings phase ambiguity
  • 相关文献

参考文献1

二级参考文献11

  • 1郭彤,胡春光,陈津平,傅星,胡小唐.垂直扫描白光干涉术用于微机电系统的尺寸表征[J].光学学报,2007,27(4):668-672. 被引量:18
  • 2Gao F,Leach R K,Petzing J,et al.Surface measurement errors using commercial scanning white light interferometers[J].Meas Sci Technol,2008,19(10):015303.
  • 3Roy M,Cooper I,Moore P,et al.White-light interference microscopy:Effects of multiple reflections within a surface film[J].Optics Express,2005,13(1):164-170.
  • 4Rhee H G,Vorburger T V,Lee J W,et al.Discrepancies between roughness measurements obtained with phase-shifting and white-light interferometry[J].Appl Opt,2005,44(28):5919-5927.
  • 5Niehues J,Lehmann P,Bobey K.Dual-wavelength vertical scanning low-coherence interferometric microscope[J].Appl Opt,2007,46(29):7141-7148.
  • 6Marroquin J L,Rivera M.Quadratic regularization functionals for phase unwrapping[J].Optical Society of America,1995,12(11):2393-2400.
  • 7Hanhijaervi K,Aaltonen J,Kassamakov I,et al.Effect of LED spectral shift on vertical resolution in stroboscopic white light interferometry[C] // Proceedings of SPIE.Strasbourg,France,2008:70031s-1.
  • 8Creath K.Calibration of numerical aperture effects in interferometric microscope objectives[J].Appl Opt,1989,28(15):3333-3338.
  • 9Sheppard C J R,Larkin K G.Effect of numerical aperture on interference fringe spacing[J].Appl Opt,1995,34(22):4731-4734.
  • 10Ingelstam E.Problems related to the accurate interpretation of microinterferograms[C] // National Physical Laboratory Symposium.London,Britain,1960:141-163.

共引文献7

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部