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Atomic layer deposition to heterostructures for application in gas sensors 被引量:3

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摘要 Atomic layer deposition(ALD) is a versatile technique to deposit metals and metal oxide sensing materials at the atomic scale to achieve improved sensor functions. This article reviews metals and metal oxide semiconductor(MOS) heterostructures for gas sensing applications in which at least one of the preparation steps is carried out by ALD. In particular, three types of MOS-based heterostructures synthesized by ALD are discussed, including ALD of metal catalysts on MOS, ALD of metal oxides on MOS and MOS core–shell(C–S) heterostructures.The gas sensing performances of these heterostructures are carefully analyzed and discussed.Finally, the further developments required and the challenges faced by ALD for the synthesis of MOS gas sensing materials are discussed.
出处 《International Journal of Extreme Manufacturing》 SCIE EI CAS CSCD 2023年第2期171-188,共18页 极端制造(英文)
基金 financially supported by the National Natural Science Foundation of China (Nos. 61971252 and51972182) the Shandong Provincial Natural Science Foundation (ZR2020JQ27 and ZR2021YQ42) the Youth Innovation Team Project of Shandong Provincial Education Department (2020KJN015)。
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