摘要
针对不断增大的偏光片尺寸需求,结合现有中小尺寸检测工艺,设计研发了大尺寸偏光片缺陷检测工艺,解决了行业大尺寸偏光片检测自动化的问题。
In view of the demand for increasing size of polarizers,combined with the existing small and medium size detection technology,the defect detection technology of large size polarizers is designed and developed,which solves the problem of automatic detection of large size polarizers in the industry.
作者
石鹏飞
王志诚
胡文平
宋俊耀
SHI Pengfei;WANG Zhicheng;HU Wenping;SONG Junyao(China Electric Power Technology Fenghua Information Equipment Co.,Ltd.,Taiyuan 030024,China)
出处
《电子工艺技术》
2023年第4期55-58,共4页
Electronics Process Technology
关键词
偏光片
大尺寸
缺陷检测
polarizer
large size
defect detection