t检验和方差分析识别EMC测量系统间性能偏离

t Test and Variance Analysis Identify Performance Deviation Between EMC Measurement Systems

对于多套理想的同一测试参数的EMC测量系统,应该在每次对同一个性能稳定的样品进行测试时,其测量结果应该是一致的,而且随着时间的推移,测量结果也不会发生偏离,始终保持良好的一致性。本文针对同一测试参数的EMC测量系统,探讨如何利用方差分析和t检验识别不同EMC测量系统间的性能偏离,使不同EMC测量系统检测结果的测量准确度在可控范围之内。

For multiple sets of ideal EMC measurement systems with the same test parameters,the measurement results should be consistent every time the same stable performance sample is tested,and over time,the measurement results will not deviate,and always maintain good consistency.Aiming at EMC measuring systems with the same test parameters,this paper discusses how to use variance analysis and t test to identify the performance deviation between different EMC measuring systems,so that the measurement accuracy of different EMC measuring systems is within the controllable range.