期刊文献+

RRT对工业摄影测量基准尺精度影响研究

Research on Effect of RRT on Industrial Photogrammetry Scale-bar Accuracy
下载PDF
导出
摘要 针对工业摄影测量基准尺在实际工程中实测值与标定值互差较大、比例缩放不准确等问题,以RRT为研究对象,推导出了基准长度误差模型。从RRT圆度、中心定位稳健性、基准尺长度标定一致性以及标准长度测量等方面进行了试验研究。通过研究发现,模切覆膜型RRT圆度和中心定位稳健性远高于其它类型的RRT。模切覆膜型RRT基准尺长度标定间的重复性为1μm,优于印刷型RRT基准尺长度标定的重复性。采用模切覆膜型RRT基准尺对标准长度的测量误差较印刷型RRT基准尺小约33%。选择模切覆膜型RRT作为基准尺的基准靶点对于提高工业摄影测量系统的测量精度具有重要参考意义。 In response to the problem of large deviation between measured values and calibrated values,as well as inaccurate proportion scaling of industrial photogrammetric scale-bar in actual engineering,a benchmark length error model was derived using retroreflective targets(RRT)as the research object.Experimental research was conducted on RRT roundness,centering robustness,consistency of scale-bar length calibration,and standard length testing.The results showed that the roundness and centering robustness of the die-cutting coated RRT were much higher than other types of RRT.The repeatability of length calibration of the die-cutting coated RRT scale-bar was 1μm,which was better than the repeatability of length calibration of the printed RRT scale-bar.The measurement error of the standard length using the die-cutting coated RRT scale-bar was about 33%smaller than that of the printed RRT scale-bar.Therefore,selecting die-cutting coated RRT as the benchmark target for the scale-bar has important reference significance for improving the measurement accuracy of industrial photogrammetric systems.
作者 王伟峰 齐建伟 黄桂平 王新萍 刘彦荣 WANG Wei-feng;QI Jian-wei;HUANG Gui-ping;WANG Xin-ping;LIU Yan-rong(Yellow River Conservancy Technical Institute,Kaifeng 475004,China;North China University of Water Resources and Electric Power,Zhengzhou 450011,China;Aerospace Shenzhou Intelligent System Technology Co.,Ltd,Beijing 100089,China)
出处 《宇航计测技术》 CSCD 2023年第4期22-30,共9页 Journal of Astronautic Metrology and Measurement
基金 高分辨率对地观测系统国家科技重大专项(80-Y50G19-9001-22/23) 2022年河南省科技攻关项目(222102220031、222102210092) 2021年河南省高等学校重点科研项目(21B420002)。
关键词 回光反射标志 工业摄影测量 基准尺 标定 Retro-reflective target Industrial photogrammetry Scale-bar Calibration
  • 相关文献

参考文献12

二级参考文献62

共引文献142

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部