基于贝叶斯统计的汽车电子器件寿命分析

Analysis of the Life of Automotive Electronics Based on Bayesian Statistics

加速寿命试验是利用加速应力水平下的寿命特征去外推评估正常应力水平下的寿命特征的试验技术。针对在汽车智能化发展中起着重要作用的汽车电子器件,本文将服从对数正态分布的样本在步进应力加速寿命试验中的统计分析结合贝叶斯统计推断,得出了基于贝叶斯统计的加速寿命试验统计分析方法,从而实现了对汽车电子器件的寿命估计。本文通过有机发光二极管的案例应用,验证了贝叶斯对数正态分布加速寿命试验统计分析方法的可行性和有效性,对相关理论研究和工程试验的开展具有借鉴意义。

Accelerated life test is an experimental technique that uses life characteristics under accelerated stress level to extrapolate to evaluate life characteristics under normal stress level.Aiming at the automotive electronic devices that play an important role in the development of automotive intelligence,this paper combines the statistical analysis of samples subject to lognormal distribution in the stepwise stress accelerated life test combined with Bayesian statistical inference to obtain a statistical analysis method for accelerated life test based on Bayesian statistics,so as to realize the life estimation of automotive electronic devices.In this paper,the feasibility and eff ectiveness of Bayesian statistical analysis method for lognormal distribution accelerated life test are verifi ed through the case application of organic light-emitting diodes,which has reference signifi cance for related theoretical research and engineering experiments.