期刊文献+

晶圆制造双闭环Interbay物料运输系统性能分析模型

A Performance Analysis Model for Semiconductor Wafer Fabrication Interbay Material Handling System with Double Closed-Loop
原文传递
导出
摘要 双闭环Interbay物料运输系统是300 mm晶圆制造系统至关重要的组成部分。为在设计阶段快速有效分析其运行性能,本文提出了一种扩展马尔可夫模型。该模型充分考虑了运输小车在外环、内环和捷径导轨关键节点的运行、堵塞、装卸晶圆卡等系统状态,抑制了多运输小车运行环境下的模型状态空间规模爆炸,提高了性能分析模型的准确性与运算效率。采用某晶圆制造企业实际生产数据,将扩展马尔可夫模型与仿真模型进行比较。结果表明:两者在空载运输小车到达时间间隔、系统搬运能力和运输小车利用率等关键指标方面相对误差值较小;扩展马尔可夫模型明显具有更高的分析效率。由此验证了提出的扩展马尔可夫模型用于双闭环Interbay系统性能分析是有效的。 Interbay material handling systems with double closed-loop have been critical subsystems of the 300 mm semiconductor wafer fabrication systems.To rapidly and effectively analyze the performances of the Interbay systems in their design stage,an extended Markov model was proposed.The vehicle's operation states in outer and inner closed-loops and shortcuts,such as moving.blocking,and loading/unloading wafer lots,were fully considered in the model.In addition,the state space explosion phenomenon of the model was suppressed.Thus,the accuracy and operational efficiency of the model were improved.With production data of a semiconductor wafer fabrication line,the proposed Markov model was validated and compared with a simulation model.The result shows that two models have a small relative error in the aspects of empty OHT's mean arrival time interval,system throughput capacity,and vehicle's mean utilization ratio.However,the proposed model is more efficient than the simulation model.It means that the proposed extended Markov model is effective.
作者 吴立辉 张中伟 胡文博 张洁 WU Lihui;ZHANG Zhongwei;HU Wenbo;ZHANG Jie(School of Mechanical Engineering,Shanghai Institute of Technology,Shanghai 201418,China;School of Mechanical&Electrical Engineering,Henan University of Technology,Zhengzhou,Henan 450001,China;Institute of Artificial Intelligence,Donghua University,Shanghai 201620,China)
出处 《工业工程与管理》 CSCD 北大核心 2023年第3期135-144,共10页 Industrial Engineering and Management
基金 国家自然科学基金项目(U1704156)。
关键词 晶圆制造 Interbay物料运输系统 双闭环 扩展马尔可夫模型 性能分析 wafer fabrication interbay material handling system double closed-loop extended Markov model performance analysis
  • 相关文献

参考文献4

二级参考文献43

  • 1AGRAWAL G K,HERAGU S S.A survey of automated material handling systems in 300-mm semiconductor fabs[J].IEEE Transactions on Semiconductor Manufacturing,2006,19(1):112-120.
  • 2KLEMMT A,WEIGERT G,WERNER S.Optimisation approaches for batch scheduling in semiconductor manufacturing[J].European Journal of Industrial Engineering,2011,5 (3):338-359.
  • 3VIS I F A,DE-KOSTER R,ROODBERGEN K J,et al.Determination of the number of automated guided vehicles required at a semi-automated container terminal[J].Journal of the Operational Research Society,2001,52(4):409-417.
  • 4STEELE J.An algorithm for estimating the performance of an automated material handling system for the semiconductor industry[C]//Proceeding of the Conference on Modeling and Analysis of Semiconductor Manufacturing.San Diego,Cal.,USA:The Society for Computer Simulation Inerational,2002:229-234.
  • 5KOO P H,JANG J J,SUH J.Estimation of part waiting time and fleet sizing in AGV systems[J].International Journal of Flexible Manufacturing Systems,2004,16 (3):211-228.
  • 6SMITH J M.Robustness of state-dependent queues and material handling systems[J].International Journal of Production Research,2010,48(16):4631-4663.
  • 7HONG S,JOHNSON A L,CARLO H J,et al.Optimizing the location of crossovers in conveyor-based automated material handling systems in semiconductor wafer fabs[J].International Journal of Production Research,2011,49 (20):6199-6226.
  • 8KAHRAMAN A F,GOSAVI A,OTY K J.Stochastic modeling of an automated guided vehicle system with one vehicle and a closed-loop path[J].IEEE Transactions on Automation Science and Engineering,2008,5 (3):504-518.
  • 9NAZZAL D,MCGINNIS L F.Throughput performance analysis for closed-loop vehicle-based material handling systems[J].IIE Transactions,2008,40 (11):1097-1106.
  • 10NAZZAK D,MCGINNIS L F.An analytical model of vehicle-based automated material handling systems in semiconductor fabs[C]//Proceedings of the 2006 Winter Simulation Conference.New York,N.Y.,USA:Institute of Electrical and Electronics Engineers Inc.,2006:1871-1879.

共引文献9

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部