一种基于ATE测试机的高低温自动测试方法分析

Analysis of a High and Low Temperature Automatic Testing Method Based on ATE Testing Machine

阐述一个利用ATE测试设备对芯片的高低温测试进行自动化测试的方法。探讨用ATE测试机的自动测试功能,对芯片的所有需要测试参数进行自动测试、测试后的数据分析,得出需要的测试结果。

This paper describes a method of Test automation for high and low temperature test of chips using ATE test equipment. Explore the automatic testing function of ATE testing machine, automatically test all required testing parameters of the chip, analyze the data after testing, and obtain the required test results.