量子精密测量参数估计优化研究进展

Research progress of parameter estimation optimization in quantum metrology

量子精密测量是利用量子叠加与纠缠、量子相互作用过程与量子测量等方式增强参数估计精度与灵敏度的技术,是在短中期内最具前景的量子技术之一。本文从量子精密测量的最优化研究方案出发,通过对大量的相关文献进行梳理归纳,分析出量子精密测量三大优化方案:量子态制备与测量最优方案、量子演化过程调控方案与经典后处理优化方案,并对三个基本优化方案进行总结分析。同时介绍了国内外量子精密测量技术的最新理论与实验进展。最后,总结了量子精密测量存在的问题与挑战,并对未来工作进行了展望。

Quantum metrology is a technology to enhance the accuracy and sensitivity of parameter estimation by using quantum superposition and entanglement,quantum interaction process and quantum measurement.It is one of the most promising quantum technologies in the short and medium term.Starting from the optimization research scheme of quantum metrology,we analyze three optimization schemes of quantum metrology by combing and summarizing related literatures,which are categorized into:quantum state preparation and measurement,the control of quantum evolution process and the classical postprocessing optimization.The latest theoretical and experimental progresses of quantum metrology are introduced.Finally,the problems and challenges of quantum metrology are summarized,and the further work is prospected.