光伏二极管应用可靠性建模与评价研究

Research on Reliability Modeling and Evaluation of Photovoltaic Diode Applications

结合光伏二极管的应用环境,分析其工作寿命周期、应力分布和应用环境对光伏二极管的影响,建立了更为实际的应用可靠性模型。设计了针对性的加速应力试验,结合性能退化试验数据和失效阈值推定出伪失效寿命,根据伪失效寿命、分布假设和拟合优度检验评估了加速应力条件下的寿命分布参数。通过各应力适用的加速模型进行了试验应力和工作应力的折算,评估出光伏二极管应用的可靠性模型参数,完成了应用可靠性评价。该方法在传统评价方法的基础上引入了工作应力分布的权重因子,进一步完善了光伏二极管的应用可靠性模型,可为类似器件的可靠性评价提供技术参考。

Combined with the application environment of photovoltaic diodes,the influence of operating life cycle,stress distribution and application environment on photovoltaic diodes are analyzed to establish a more practical application reliability photovoltaic diode model.By designing targeted accelerated stress tests,the pseudo-failure lives are calculated using test data of performance degradation and failure threshold value,and life distribution parameters under accelerated stress conditions are evaluated based on pseudo-failure life,distribution assumptions,and test for goodness of fit.The test stresses and working stresses are converted by the accelerated model applicable to each stress,and the reliability model parameters for photovoltaic diode applications are assessed to complete the application reliability evaluation.Based on the traditional evaluation method,the weight factor of working stress distribution is introduced to furtherly improve the application reliability model for photovoltaic diode,which can provide technical reference for reliability evaluation of similardevices.