基于部分故障的威布尔分布寿命数据分析

Analysis of Weibull Distribution Life Data Based on Fractional Failure

当前产品的研发周期越来越短、复杂性也逐步增加。如何在产品研发阶段,使用较少的样本验证产品的可靠性以及验证产品改进措施的有效性,是工程师迫切需要解决的问题。本文在分析部分故障产生的原因基础上,给出部分故障的数据处理方法以及部分故障情况下的威布尔分布的寿命数据计算模型。最后以计算实例分别给出了不考虑该改进措施有效性、考虑改进措施有效性以及改进措施100%有效时的计算结果。通过计算实例,验证了本文所提方法的合理性,为存在部分故障的寿命数据分析工作的实施,提供技术参考。

The current product development cycle is becoming shorter and more complex.How to use fewer samples to verify the reliability of products and the effectiveness of product improvement measures during the product development stage is an urgent problem that engineers need to solve.Based on analyzing the causes of fractional failure,this article provides a data processing method for fractional failure and a life data calculation model for Weibull distribution under fractional failure conditions.Finally,calculation result of without considering the effectiveness of the improvement measures,considering the effectiveness of the improvement measures,and considering the 1oo%effectiveness of the improvement measures were provided.Through calculation examples,the rationality of the method proposed in this article has been verified,and providing technical reference for the implementation of life data analysis work with fractional failure.