摘要
针对电子元器件应用过程中常见故障频发的缺陷,分析了电子元器件的选型项目和选型应力。紧紧围绕电子元器件的稳定性,对一些常见的选型项目,提出了典型的选型规划方案。最后以二极管为研究对象,分析了电子器件筛选程序。
Aiming at the defects of frequent common failures in the application process of electronic components,the selection items and selection stresses of electronic components are analyzed.Focusing on the stability of electronic components,the typical selection plan is proposed for some common screening items.Finally,taking diode as the research object,the screening program of electronic components is analyzed.
作者
孔德昊
KONG Dehao(CEPREI-EAST,Suzhou 215011,China)
出处
《电子产品可靠性与环境试验》
2023年第5期43-46,共4页
Electronic Product Reliability and Environmental Testing
关键词
电子元器件
可靠性
二极管
筛选
electronic components
reliability
diodes
screening