不同遮挡情况下半片组件及二极管的分析研究

Analysis and research of half-cut modules and diodes under different shading conditions

以半片组件为研究对象,对不同遮挡情况下的二极管状态进行分析,过程中采用了测试二极管两端电压、组件发热IR分析、组件接入固定负载下功率分析、不同遮挡下功率测试等多种测试方式。研究表明,在半片组件中,当单个支路中遮挡面积不足1个半片时,二极管未启动,为反向偏置,导致被遮挡电池片出现不同位置的热斑;当单个支路中遮挡1个半片电池片时,电池片不发热,此时二极管已启动,为正向偏置,与之相并联的支路被短路,无功率输出;当单个支路中遮挡达3个半片电池片时,支路处于断路状态,二极管仍然为反向偏置,与之相并联的支路正常工作,功率正常输出。该分析有助于半片组件实际应用中更好避免热斑的产生,对不同遮挡下发电量的分析有很大帮助。

The half-cut modules were taken as the research object,and the diode state under different shading conditions was analyzed.In the process,the voltage across the diode was tested,the component heating IR analysis,the power analysis when the component was connected to a fixed load,and the power test under different shading a test method.The research shows that in a half-cut module,when the shielding area in a single branch is less than a half cell,the diode is not activated and is reverse biased,and generate hot spots on the shielded cell.When there is a half cell,the cell does not heat up,the diode is activated at this time,it is forward biased,and the branch connected in parallel with it is short-circuited and no power output.When a single branch is blocked by up to three half cells,the branch is in an open circuit state,the diode is still reverse biased,the branch connected in parallel with it works normally,and the power is output normally.The analysis is helpful for the practical application of half-cut modules to better avoid the generation of hot spots,and is of great help to the analysis of power generation under different shades.