基于Cortex主控芯片的MCU测试验证方法研究

Study on Test and Verification Method of MCU Based on Cortex Master Chips

随着国家在芯片技术方面投入的加大,越来越多的国产化芯片实现量产,测试验证成为确保芯片设计与工艺质量可靠性的关键环节,可以提前判定器件功能和参数的可靠性。基于Cortex-M3内核的微处理器(MCU)芯片和V93000自动测试设备研究了一种MCU测试验证方法及流程。通过测试母版原理设计和测试向量生成,测试分析了芯片功能和关键直流参数,形成了一套芯片测试验证流程及方法,对于MCU芯片国产化测试验证具有一定的借鉴意义。

As the courtry’s investment in chip technology increases,more and more localized chips are mess-produced,test verification has become a key link to ensure the reliability of chip design and process quality,which can determine the reliability of device functions and parameters in advance.Based on the MCU chip with Cortex-M3 core and V93000 ATE,an MCU test verification method and flow are studied.Through the principle design of test master and test vector generation,the chip function and key DC parameters are tested and analyzed,and a set of chip test verification flow and method are formed,which has certain reference significance for MCU chip localization test verification.