面向米级狭缝波导的偏振模式色散测量

Polarization mode dispersion measurement for a meter-level slot waveguide

为了准确测量米级长度线型狭缝波导的准横电波(TE)和准横磁波(TM)的色散,设计了一种马赫-曾德尔干涉仪(MZI)的色散测量光路。介绍了相位拟合法和平衡波长法的测量原理,并结合测量光路进行测量。测量结果表明:滤除偏振模式间的串扰噪声,可进一步提高色散测量的准确度;通过调整波导的狭缝尺寸,可对其色散进行有效调控,当狭缝厚度为0.1μm时,波导在1440~1640 nm波长范围内具有接近零且平坦的色散。

In order to accurately measure the dispersion of quasi-transverse wave(TE)and quasi-transverse magnetic wave(TM)in meter-level linear slit waveguides,a dispersion-measuring optical path of Mach-Zehnder interferometer(MZI)is designed.The measurement principle of phase fitting method and balanced wavelength method is introduced,and the measurement is carried out in combination with the measurement optical path.The measurement results show that the accuracy of dispersion measurement can be further improved by removing the crosstalk noise between polarization modes.The dispersion of the waveguide can be effectively controlled by adjusting the slot size.When the slot thickness is 0.1μm,the waveguide has near zero and flat dispersion in the wavelength range of 1440~1640 nm.