Ka波段相控阵天线的平面近场单探头测试方法

Planar Near-field Single Probe Testing Method for Ka-band Phased Array Antenna

为满足Ka频段相控阵天线日益增长的测试需求,中国信息通信研究院泰尔系统实验室搭建了以单探头平面近场为基础的Ka频段相控阵天线测试系统。系统采用单探头扫描方式进行近场数据采集,运用近远场转换技术生成远场数据,可从多维度分析测试结果,产生多种可视化的图形;有相控阵天线单元校准测试功能,能够为有源、数字相控阵天线提供阵面通道的一致性快速测试和配相手段。近场、远场以及实验室间的对比测试证明了平面近场测试系统的准确性。系统测试效率高、建设和运营成本低,目前已完成测试功能的调试,并为国内外多家企业完成认证测试工作,是Ka波段相控阵天线测试的可靠平台。

In order to meet the growing testing needs of Ka-band phased array antennas,the CTTL(China Telecommunication Technology Labs)-systems of China Academy of Information and Communications Technology has built a Ka-band phased array antenna testing system based on a single probe planar near field.The system adopts a single probe scanning method for near field data collection,and uses near-far field conversion technology to generate far-field data.It can analyze test results from multiple dimensions and generate various visualized graphics;equipped with phased array antenna unit calibration and testing function,it can provide fast testing and phase matching methods for the consistency of array channels for active and digital phased array antennas.Comparative tests in the near field,far field,and between laboratories have demonstrated the accuracy of the planar near field testing system.The system has high testing efficiency,low construction and operation costs.Currently,the debugging of testing functions has been completed,and certification testing has been completed for multiple domestic and foreign enterprises.It is a reliable platform for Ka-band phased array antenna testing.