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Van der Waals contacted WSe_(2) ambipolar transistor for in-sensor computing 被引量:1

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摘要 Image sensors with an in-sensor computing architecture have shown great potential in meeting the energy-efficient requirements of emergent data-intensive applications,where images are processed within the photodiode arrays.It demands the composed photodiodes are reconfigurable,which are usually achieved by ambipolar two-dimensional(2D)semiconductors.To improve the ambipolar charges injection,here we report a top-gated field-effect transistor(FET)design that is of bottom van der Waals contact via transferring ambipolar 2D WSe_(2) onto Pd/Cr source/drain electrodes.The devices exhibit nearly negligible effective barrier heights for both holes and electrons based on thermionic emission mode,and show an almost balanced on/off ratio in the p-branch and n-branch.By replacing the top gate with two aligned semi-gates,the devices can effectively function as reconfigurable photodiodes.They can be switched between PIN and NIP configurations via controlling the two semi-gates,exhibiting good linearity in terms of short-circuit current(ISC)and incident light power density.The photodiode arrays are also demonstrated for in-sensor optoelectronic convolutional image processing,showing significant potential for in-sensor computing image processors.
出处 《Nano Research》 SCIE EI CSCD 2023年第11期12713-12719,共7页 纳米研究(英文版)
基金 supported by the National Natural Science Foundation of China(No.62274037) the National Key Research and Development Program of China(No.2018YFA0703703) the Ministry of Science and Technology of China(No.2018YFE0118300) State Key Laboratory of ASIC&System(No.2021MS003).
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