绝缘子表面氟化对金属颗粒的活性抑制

Inhibition of Metal Particle Activity by Fluorination on the Surface of Insulators

异物放电为GIS/GIL设备运行过程中绝缘击穿的主要原因,为提升设备运行过程中内部异物起始电压,文中开展了绝缘子表面直接氟化提升异物下绝缘性能研究。搭建了绝缘子直接氟化处理系统及220kV GIS真型试验系统,开展了126kV绝缘子表面氟化前后设备内部无异物缺陷、绝缘子表面异物吸附缺陷、罐体表面自由异物缺陷等状态下直流耐受性能试验。发现0.2MPaSF6气体环境下,氟化绝缘子平均闪络电压较未氟化提升13.5%,氟化绝缘子表面异物吸附平均闪络电压较未氟化绝缘子提升21.5%,126kV氟化绝缘子下罐体内部自由金属异物最低闪络电压较未氟化绝缘子提升18.6%,相应的试验结果可为GIS/GIL内部异物活性抑制提供支撑。

The discharge of foreign matter is the main cause of insulation breakdown in the operation of GIS/GIL equipment.For improving the initial voltage of internal foreign matter during operation of the equipment,a study on the improvement of insulation performance under foreign matter by fluorination on the surface of insulator surface to improve insulation performance under foreign matter is developed.The direct fluorination treatment system for insula-tors and a 220 kV GIS real test system are set up and the DC withstand performance tests under such conditions as no foreign matter defects inside the equipment,foreign matter adsorption defects on the surface of insulators and free for-eign matter defects on the surface of the enclosure before and after fluorination of 126 kV insulator surface is devel-oped.It is found that at 0.2 MPa SF6 gas environment,the average flashover voltage of fluorinated insulators is in-creased by 13.5%compared to unfluorinated insulators,the average flashover voltage of foreign matter adsorption on the surface of fluorinated insulators is increased by 21.5%compared to unfluorinated insulators,and the minimum flashover voltage of free metal foreign matter inside the enclosure under 126 kV fluorinated insulators is increased by 18.6%compared to unfluorinated insulators.The corresponding test results can provide support for the suppression of foreign matter activity inside GIS/GIL.