DSP芯片动态老炼系统设计与实现

Design and implementation of dynamic burn⁃in system for DSP chips

在集成电路的可靠性筛选试验中,老炼试验是最重要和最有效的试验。针对静态老炼和传统动态老炼方式的局限性,提出了一种DSP芯片动态老炼系统的设计与实现方法。该动态老炼系统实现了老炼程序自动加载,可以实时监测每个工位老炼试验情况,将老炼过程中发现的失效电路及时剔除,试验结果可以自动存储,便于后期进行试验结果分析。相比静态老炼和传统动态老炼方式,该系统测试覆盖率更高,提高了产品可靠性。

In the reliability screening test of integrated circuits,burn⁃in test is the most important and effective test.A design and implementation method of dynamic burn⁃in system for DSP chips is proposed to address the limitations of static burn⁃in and traditional dynamic burn⁃in methods.This dynamic burn⁃in system realizes automatic loading of burn⁃in programs,which can monitor the burn⁃in test status of each workstation in real⁃time.It can timely remove any failed circuits found during the burn⁃in process,and the test results can be automatically stored for later analysis of test results.Compared to static burn⁃in and traditional dynamic burn⁃in methods,dynamic burn⁃in testing has higher coverage and improves product reliability.