反铁电多层陶瓷电容器加速寿命试验与建模技术

Accelerated Life Test and Modeling Techniques for Antiferroelectric Multilayer Ceramic Capacitors

本文研究了反铁电多层陶瓷电容器的温度、电压、电流多应力因子加速寿命试验方法与可靠性寿命建模技术,选取宏科电子公司的GCT41P-7680-X7Q-4000V-623M型号脉冲功率多层瓷介电容器样品,开展高温、高电压、大电流循环充放电寿命试验,获得了40个试样的加速寿命试验数据,基于试验数据分析结果,建立了反铁电多层陶瓷电容器PV+寿命预测模型以及相应的模型模型参数值。试验失效样品DPA分析发现,反铁电多层陶瓷电容器充放电循环工作失效模式为内电极界面分层失效,并就其失效机理进行了初步探讨分析。

The temperature,voltage,and current multiple stress factor accelerated life testing method as well as the reliability life modeling technology of antiferroelectric multilayer ceramic capacitors is studied.Power pulse multilayer ceramic capacitor GCT41P-7680-X7Q-4000V-623M samples from Hongke Electronics were selected to conduct high-temperature,high-voltage,and high current cyclic charge and discharge life tests.Accelerated life test data of 40 samples were obtained on the analysis results of the test data,A PV+life prediction model and corresponding model parameter values for antiferroelectric multilayer ceramic capacitors have been established.The DPA analysis of the failed samples in the experiment found that the failure mode of the anti ferroelectric multilayer ceramic capacitor during charge discharge cycling was the delamination failure at the inner electrode interface,and the failure mechanism was preliminarily explored and analyzed.